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Focused Ion Beam Sample Preparation
 With focused ion beam sample preparation, both a bulk stage and a site entry stage are available. A microsampling function is available enabling fabrication of thin film samples for electron microscopes directly from bulk samples without removing the sample from the vacuum. Moreover, the use of a CAD system makes it possible to fabricate samples with graphics microfabricated onto the surface as desired.
Focused Ion Beam Sample Preparation
Laboratory Equipment
Reaction Science high-voltage scanning transmission electron microscope
High Resolution Electron Microscope
Field Emission Electron Microscope
Analysis Electron Microscope
Focused Ion Beam Sample Preparation
Sample Preparation Devices
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