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Equipment
■ High Voltage Scanning Transmission Electron Microscope
Name of Device Basic Features Purpose of Device
Reaction Science high-voltage scanning transmission electron microscope Max voltage acceleration: 1000 kV
Point resolution:0.15nm
CTEM / STEM
Thick sample observation
more
■ Electron Microscope Cluster
Name of Device Basic Features Purpose of Device
High Resolution Electron Microscope Max voltage acceleration: 200kV
Resolution: 0.23nm
Conventional observations
Field emission observations
Electric transport experiments
more
Field Emission Electron Microscope Max voltage acceleration: 200 kV
Resolution: 0.23 nm
Cathode ray holography more
Analysis Electron Microscope Max voltage acceleration: 300 kV
Resolution: 0.18 nm
Analysis(GIF)
High temperature observation, low temperature observation, atmospheric observation
more
■ Sample Preparation Devices
Name of Device Basic Features Purpose of Device
Focused Ion Beam Sample Preparation Accelerating voltage 10〜40kV
Magnification 150〜300,000/60〜300,000(SIM Image)
Ga loaded into an ion gun is ionized and fired into a sample as a focused ion beam for processing. more
Laboratory Equipment
Reaction Science high-voltage scanning transmission electron microscope
High Resolution Electron Microscope
Field Emission Electron Microscope
Analysis Electron Microscope
Focused Ion Beam Sample Preparation
Sample Preparation Devices
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