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01/12/2012"Notice of electron microscope workshop for companies"
Course:200kV Transmission Electron Microscopy、Focused Ion Beam Sample Preparation(FIB、PIPS)
Date:03/12/2012(Mon) 〜 28/02/2013(Thu)
    one day at any time from Monday to Thursday at 10:00〜16:00
Place:High Voltage Electron Microscope Laboratory of Nagoya University
Guideline:electron microscope practical skill and
                  Focused Ion Beam Sample Preparation practical skill
        details and application, click here
31/08/2012We participated in the Nagoya University Techno Fair.
02/07/2012The MEXT Nanotechnology Platformwas launched.
Laboratory Equipment
Reaction Science high-voltage scanning transmission electron microscope
High Resolution Electron Microscope
Field Emission Electron Microscope
Analysis Electron Microscope
Focused Ion Beam Sample Preparation
Sample Preparation Devices
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