Course:200kV Transmission Electron Microscopy、Focused Ion Beam Sample Preparation(FIB、PIPS)
Date:03/12/2012(Mon) 〜 28/02/2013(Thu)
one day at any time from Monday to Thursday at 10:00〜16:00
Place:High Voltage Electron Microscope Laboratory of Nagoya University
Guideline:electron microscope practical skill and
Focused Ion Beam Sample Preparation practical skill
details and application, click
here